-
1
-
-
84950274888
-
-
University of Bari, Italy
-
Altomare, A., Cascarano, G., Giacovazzo, C., Guagliardi, A., Burla, M. C., Polidori, G. & Camalli, M. (1992). SIR92 User's Manual. University of Bari, Italy.
-
(1992)
SIR92 User's Manual
-
-
Altomare, A.1
Cascarano, G.2
Giacovazzo, C.3
Guagliardi, A.4
Burla, M.C.5
Polidori, G.6
Camalli, M.7
-
3
-
-
0003409324
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Fait, J. (1991). XSCANS User's Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1991)
XSCANS User's Manual
-
-
Fait, J.1
-
4
-
-
0007817471
-
-
Griffith, E. A. H., Charles, N. G., Rodesiler, P. F. & Amma, E. L. (1983). Acta Cryst. C39, 331-333.
-
(1983)
Acta Cryst.
, vol.C39
, pp. 331-333
-
-
Griffith, E.A.H.1
Charles, N.G.2
Rodesiler, P.F.3
Amma, E.L.4
-
5
-
-
0029936268
-
-
Howard-Lock, H. E., LeBlanc, D. J., Lock, C. J. L., Smith, R. W. & Wang, Z. (1996). J. Chem. Soc. Chem. Commun. pp. 1391-1392.
-
(1996)
J. Chem. Soc. Chem. Commun.
, pp. 1391-1392
-
-
Howard-Lock, H.E.1
LeBlanc, D.J.2
Lock, C.J.L.3
Smith, R.W.4
Wang, Z.5
-
7
-
-
0027040291
-
-
Inoue, K., Yasukawa, R., Miura, N., Baba, Y. & Yoshizuka, K. (1992). Solvent Extr. Ion Exch. 10, 769-785.
-
(1992)
Solvent Extr. Ion Exch.
, vol.10
, pp. 769-785
-
-
Inoue, K.1
Yasukawa, R.2
Miura, N.3
Baba, Y.4
Yoshizuka, K.5
-
8
-
-
0007981309
-
-
Mozzhukhin, A. O., Ovchinnikov, Yu. E., Antipin, M. Yu., Struchkov, Yu. T., Shipov, A. G., Sergeev, V. N., Artamkin, S. A. & Baukov, Yu. I. (1993). Izv. Akad. Nauk SSSR Ser. Khim. pp. 198-202.
-
(1993)
Izv. Akad. Nauk SSSR Ser. Khim.
, pp. 198-202
-
-
Mozzhukhin, A.O.1
Ovchinnikov, Yu.E.2
Antipin, Yu.M.3
Struchkov, Yu.T.4
Shipov, A.G.5
Sergeev, V.N.6
Artamkin, S.A.7
Baukov, Yu.I.8
-
9
-
-
25544480666
-
-
Masters thesis, Facultad de Química, UNAM, Mexico
-
Nuñez, M. E. (1997). Masters thesis, Facultad de Química, UNAM, Mexico.
-
(1997)
-
-
Nuñez, M.E.1
-
10
-
-
0031695961
-
-
Nuñez, M. E., Bernés, S., Rodríguez de San Miguel Guerrero, E., Bernal, J. P. & de Gyves, J. (1998). Acta Cryst. C54, 49-51.
-
(1998)
Acta Cryst.
, vol.C54
, pp. 49-51
-
-
Nuñez, M.E.1
Bernés, S.2
Rodríguez De San Miguel Guerrero, E.3
Bernal, J.P.4
De Gyves, J.5
-
11
-
-
0022946849
-
-
Sato, T., Ishikawa, I. & Sato, K. (1986). Proc. ISEC II, pp. 159-163.
-
(1986)
Proc. ISEC
, vol.2
, pp. 159-163
-
-
Sato, T.1
Ishikawa, I.2
Sato, K.3
-
12
-
-
84875254488
-
-
Release 5.03. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Sheldrick, G. M. (1995). SHELXTL-Plus. Release 5.03. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1995)
SHELXTL-Plus
-
-
Sheldrick, G.M.1
-
14
-
-
0000691077
-
-
Xiong, R.-G., Zuo, J.-L. & You, X.-Z. (1997). Inorg. Chem. 36, 2472-2474.
-
(1997)
Inorg. Chem.
, vol.36
, pp. 2472-2474
-
-
Xiong, R.-G.1
Zuo, J.-L.2
You, X.-Z.3
|