Accelerated Outage Probability Testing for PMD Induced Impairment

IEEE Photonics Technology Letters

Volumn 12, Issue 10, 2000, Pages 1364-1366

  Shieh, William ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

Accelerated testing; Optical communication; Optical dispersion; Optical fiber polarization; Optical fibers; Polarization mode dispersion (PMD)

Indexed keywords

EID: 0000219590     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.883831     Document Type: Article

References (10)

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