Self-assembled cobalt-diisocyanobenzene multilayer thin films

Chemistry of Materials

Volumn 8, Issue 3, 1996, Pages 591-594

  Ansell, Michael A ^a   Zeppenfeld, Astrid C ^a   Yoshimoto, Kenichi ^a   Cogan, Elizabeth B ^a   Page, Catherine J ^a  

^a UNIVERSITY OF OREGON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000218061     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm950346m     Document Type: Article

References (30)

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19. 2.
20. 2/acetone for 30 min followed by the DiCNB solution for 90 min. Experiments have shown that these soak times give optimal layer thicknesses as determined by ellipsometry.
21. Ellipsometry was done using a Rudolph thin-film ellipsometer 43702-200E with a tungsten halogen light source and a 632 nm filter. Thicknesses were calculated using DafIBM (version 2.1) provided by Rudolph, assuming an index of refraction of 3.858-0.018i for the silicon substrates.
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24. Grazing angle X-ray diffraction was measured using a Scintag XDS-2000 θ-θ powder diffractometer while scanning at low angles to observe interference between X-ray reflection from the front and back of the thin films.
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26. ATR-FTIR spectra were obtained using polished 50 × 10 × 3 spp 45° silicon parallelogram ATR crystals using a Harrick TMP-220 ATR attachment on a Nicolet Magna IR Model 550 FT-IR spectrometer.
27. Peaks were deconvoluted and peak areas were determined using Spectracalc, version A2.23 (Galactic Industries).
28. -8 Torr. Survey scans were done using a 45° takeoff angle.
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