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Volumn 87, Issue 8, 2000, Pages 3843-3849
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Characterization of deep impurities in semiconductors by terahertz tunneling ionization
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000212751
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.372423 Document Type: Article |
Times cited : (72)
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References (19)
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