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Volumn 87, Issue 8, 2000, Pages 3843-3849

Characterization of deep impurities in semiconductors by terahertz tunneling ionization

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[No Author keywords available]

Indexed keywords


EID: 0000212751     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372423     Document Type: Article
Times cited : (72)

References (19)
  • 11
    • 0004630942 scopus 로고
    • V. Karpus and V. I. Perel, Zh. Éksp. Teor. Fiz. 91, 2319 (1986) [Sov. Phys. JETP 64, 1376 (1986)].
    • (1986) Sov. Phys. JETP , vol.64 , pp. 1376


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.