|
Volumn 80, Issue B, 1999, Pages 440-442
|
Precision X-ray spectroscopy at the NIST electron-beam ion trap: Resolution of major systematic error
a a b b b c,d |
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0000203160
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (14)
|
References (15)
|