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Volumn 19, Issue 2-4, 1997, Pages 267-275

Application of X-ray diffraction in Laue geometry to imperfect near-surface layers

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000200854     PISSN: 03926737     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF03040982     Document Type: Article
Times cited : (6)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.