Topological analysis of experimental electron densities

Journal of Applied Crystallography

Volumn 32, Issue 2, 1999, Pages 210-217

  Souhassou, Mohamed ^a   Blessing, Robert H ^b  

^a Nancy University CNRS   (France)

^b HAUPTMAN WOODWARD MEDICAL RESEARCH INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000199539     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889898011923     Document Type: Article

References (12)

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