Pyrometric interferometry during MBE growth of laser hetero structures

Thin Solid Films

Volumn 367, Issue 1-2, 2000, Pages 299-301

  Muszalski, Jan ^a,b  

^a ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

^b NONE   (Poland)

Author keywords

Molecular beam epitaxy; Pyrometric interferometry; Vertical cavity surface emitting lasers

Indexed keywords

EID: 0000189294     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00692-1     Document Type: Article

References (5)

1. A.J. Spring-Thorpe, T.P. Humphreys, A. Majeed, W.T. Moore, Appl. Phys. Lett. 55 (1989) 2138.
2. H. Grothe, F.G. Boebel, J. Cryst. Growth 127 (1993) 1010.
3. H.P. Lee, R. Renalli, X. Liu, Appl. Phys. Lett. 67 (1995) 1824.
4. J. Muszalski, T. Ochalski, M. Bugajski, Apparent Substrate Temperature Oscillations during MBE Growth of Laser Heterostructures XXVIII International School on Physics of Semiconducting Compounds 'Jaszowiec '98', June 7-12, 1998.
5. 1-xAs/GaAs planar microcavities with DBR reflectors. NATO Advanced Research Workshop, Optical Properties of Semiconductor Nanostructures. Ustron-Jaszowiec, 12-16 June, 1999.