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Volumn 5, Issue 7, 1993, Pages 1000-1006

Synthesis, Structural Characterization, and Intercalation Chemistry of Two Layered Cadmium Organophosphonates

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EID: 0000186288     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm00031a021     Document Type: Article
Times cited : (110)

References (47)
  • 1
    • 54749137768 scopus 로고
    • General reviews: (a)
    • General reviews: (a) Clearfield, A. Comments Inorg. Chem. 1990, 10, 89–128.
    • (1990) Comments Inorg. Chem. , vol.10 , pp. 89-128
  • 41
    • 84908816588 scopus 로고
    • Siemens X-ray Analytical Instruments, Inc., Madison, WI
    • Sheldrick, G. M. SHELXTL-PLUS (Version 4.11). Siemens X-ray Analytical Instruments, Inc., Madison, WI, 1991.
    • (1991) SHELXTL-PLUS (Version 4.11)
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.