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Volumn 54, Issue 9, 1998, Pages 1217-1219

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Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000184810     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S010827019800448X     Document Type: Article
Times cited : (13)

References (16)
  • 11
    • 0004229175 scopus 로고
    • MSC, 3200 Research Forest Drive, The Woodlands, TX 77381, USA
    • Molecular Structure Corporation (1992). MSC/AFC Diffractometer Control Software. Version 4.3.0. MSC, 3200 Research Forest Drive, The Woodlands, TX 77381, USA.
    • (1992) MSC/AFC Diffractometer Control Software. Version 4.3.0
  • 14
    • 0001647167 scopus 로고
    • edited by G. M. Sheldrick, C. Krüger & R. Goddard, Oxford University Press
    • Sheldrick, G. M. (1985). SHELXS86. Crystallographic Computing 3, edited by G. M. Sheldrick, C. Krüger & R. Goddard, pp. 175-189. Oxford University Press.
    • (1985) SHELXS86. Crystallographic Computing 3 , pp. 175-189
    • Sheldrick, G.M.1
  • 15
    • 0004150157 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M. (1990). SHELXTL-Plus. Version 4.0. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1990) SHELXTL-Plus. Version 4.0
    • Sheldrick, G.M.1
  • 16


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.