Stimulated emission depletion microscopy with an offset depleting beam

Applied Physics Letters

Volumn 78, Issue 4, 2001, Pages 393-395

  Klar, T A ^a   Dyba, M ^a   Hell, S W ^a  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000183912     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1338491     Document Type: Article

References (7)

1. S. W. Hell and J. Wichmann, Opt Lett. 19, 780 (1994).
2. T. A. Klar and S. W. Hell, Opt. Lett. 24, 954 (1999).
3. T. A. Klar, S. Jakobs, M. Dyba, A. Egner, and S. W. Hell, Proc. Natl. Acad. Sci. U.S.A. 97, 8206 (2000).
4. N. R. Heckenberg, R. G. McDuff, C. P. Smith, H. Rubinsztein-Dunlop, and M. J. Wegener, Opt. Quantum Electron. 24, 5951 (1992).
5. S. W. Hell, in Topics in Fluorescence Spectroscopy, edited by J. R. Lakowicz (Plenum, New York, 1997), Vol. 5, p. 361.
6. B. Richards and E. Wolf, Proc. R. Soc. London, Ser. A 253, 358 (1959).
7. M. Dyba, T. A. Klar, S. Jakobs, and S. W. Hell, Appl. Phys. Lett. 77, 597 (2000).