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Volumn 56, Issue 12, 1997, Pages R7080-R7083

Long-range behavior of the layer-by-layer growth in Si/Si(111)-7×7 homoepitaxy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000182846     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.R7080     Document Type: Article
Times cited : (7)

References (11)
  • 8
    • 0003472812 scopus 로고
    • Addison-Wesley, Reading, Massachusetts
    • B. E. Warren, X-ray Diffraction (Addison-Wesley, Reading, Massachusetts, 1969), Chap. 13.
    • (1969) X-ray Diffraction
    • Warren, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.