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Volumn 83, Issue 7, 1998, Pages 3609-3613

Photoluminescence study of defects in Si+ ion implanted thermal SiO2 films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000181581     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366578     Document Type: Article
Times cited : (33)

References (26)
  • 20
    • 0004206716 scopus 로고
    • edited by P. Balk Elsevier, Amsterdam
    • 2 System, edited by P. Balk (Elsevier, Amsterdam, 1988).
    • (1988) 2 System
    • Helms, C.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.