In situ analysis of cationic surfactants on electrode surfaces by FT-SERS microprobe spectroscopy. 1. Adsorption of cetylpyridinium bromide

Langmuir

Volumn 12, Issue 22, 1996, Pages 5279-5288

  Kreisig, S M ^a   Tarazona, A ^a   Koglin, E ^a   Schwuger, M J ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000178799     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la951009v     Document Type: Article

References (45)

1. Klumpp, E.; Struck, B. D.; Schwuger, M. J. Nachr. Chem., Tech. Lab. 1992, 40, 428-435.
2. Fabry, B. ChiuZ 1991, 25 (4), 214-222.
3. Schwuger, M. J.; von Rybinski, W. Tenside Deterg. 1986, 23 (4), 200-207.
4. Jeanmaire, D. L.; Van Duyne, R. P. J. Electroanal. Chem. 1977, 84, 1-24.
5. Albrecht, M. G.; Creighton, J. A. J. Am. Chem. Soc, 1977, 99, 5215-5217.
6. Moskovits, M. J. Chem. Phys. 1978, 69, 4159-4161.
7. Chang, R., Furtak, T. E., Eds. Surface Enhanced Raman Scattering; Plenum Press: New York, 1982.
8. Otto, A. In Light Scattering in Solids IV; Cardona, M., Günthrodt, G., Eds.; Springer-Verlag: Berlin, 1984; pp 289-418.
9. Chang, R. K.; Laube, B. L. CRC Crit. Rev. Solid State Mater. Sci. 1984, 12, 1-73.
10. Moskowits, M. Rev. Mod. Phys. 1985, 57, 783-826.
11. Koglin, E.; Séquaris, J.-M. In Topics in Current Chemistry; Dewar, M., Borgstedt, H. U., Eds.; Springer-Verlag: Berlin, 1986; Vol. 134, pp 1-53.
12. Zeeman, E.; Schatz, G. C. J. Phys. Chem. 1987, 97, 634-643.
13. Creighton, J. A. In Spectroscopy of surfaces; Clark, R. J. H., Hester, R. E., Eds.; J. Wiley & Sons: Chichester, 1988; pp 37-89.
14. Birke, R. L.; Lombardi, J. R. In Spectroelectrochemistry: Theory and Practice; Gale, R. J., Ed.; Plenum Press: New York, 1988; pp 263-348.
15. Garrel, R, L. Anal. Chem. 1989, 61, 401A-411A.
16. Cotton, T. M.; Kim, J. H.; Chumanov,G. D. J. Raman Spectrosc. 1991, 22, 729-740.
17. Otto, A. J. Raman Spectrosc. 1991, 22, 743-752.
18. Otto, A.; Mrozek, I.; Grabhorn, H.; Akemann, W. J. Phys.: Condens. Matter 1992, 4, 1143-1212.
19. Yang, W.-H.; Schatz, G. C. J. Chem. Phys. 1992, 97, 3831-3845.
20. Nakai, H.; Nakatsji, H. J. Chem. Phys. 1995, 103, 2286-2294.
21. Koglin, E.; Séquaris, J.-M. J. Phys. 1983, C10 (12), 487-490.
22. Angel, S. M.; Myrick, M. L. In Handbook of Near-Infrared Analysis: Practical Spectroscopy, Series 13; Burns, D. A., Ciurezek, E. W., Decker, M., Eds.; Dekker: New York, 1992; pp 225-245.
23. Van Duyne, R. P.; Haller, K. L.; Altkorn, R. I. Chem. Phys. Lett. 1986, 126, 190-196.
24. Koglin, E.; Schwuger, M. J. Faraday Discuss. 1992, 94, 213.
25. Markwort, L.; Hendra, P. In XIVth International Conference on Raman Spectroscopy; Yu, N.-T., Li, X.-Y., Eds.; J. Wiley & Sons: Chichester, 1994; pp 642-643.
26. Moskovits, M.; Sun, J. S. J. Phys. Chem. 1984, 88, 5526-5530.
27. Shelton, R. S.; Van Campen, M. G. J. Am. Chem. Soc 1946, 68, 757-759.
28. Lewinsky, H. H.; Golimowski, J. Private communication.
29. Frisch, M. J.; Trucks, G. W.; Head-Gordon, M.; Gill, P. M. W.; Wong, M.W.; Foresman, J. B.; Johnson, B. G.; Schlegel, H. B.; Robb, M. A.; Replogle, E. S.; Gomperts, R.; Andres, J. L.; Raghavachari, K.; Binkley, J. S.; Gonzalez, C.; Martin, R. L.; Fox, D. J.; Defrees, D. J.; Baker, J.; Stewart, J. J. P.; Pople, J. A. Gaussian 92, Revision A; Gaussian, Inc.: Pittsburgh, PA, 1992.
30. Pople, J. A.; Krishnan, R.; Schlegel, H. B.; DeFrees, D.; Binkley, J. S.; Frisch, M. J.; Whiteside, R. F.; Hout, R. F.; Hehre, W. J. Int. J. Quantum Chem. 1981, 15, 269.
31. Koglin, E.; Krug, O. In XIIIth International Conference on Roman Spectroscopy; Kiefer, W., Cardona, M., Schaak, G., Schneider, W., Schroetter, H. W., Eds.; J. Wiley & Sons: Chichester, 1992; 650-651.
32. Sun, S. C.; Bernard, I.; Birke, R. L.; Lombardi, J. R. J. Electroanal. Chem. 1985, 196, 359-374.
33. Takahashi, M.; Niwa, M.; Ito, M. J. Phys. Chem. 1987, 91, 11-14.
34. Bukowska, M.; Jackowska, K.; Jaszczynski, K. J. Electroanal. Chem. 1989, 260, 373-382.
35. Weaver, M. J.; et al. J. Phys. Chem. 1985, 89, 5040-5051; 1990, 94, 6858-6864.
36. Weaver, M. J.; et al. J. Phys. Chem. 1985, 89, 5040-5051; 1990, 94, 6858-6864.
37. Carter, D. A.; Pemberton, J. E. Langmuir 1992, 8, 1218-1225.
38. Kreisig, S. M. Anwendung der SERS-Spektroskopie zurin-situ Analyse des Adsorptionsverhaltens von Tensiden und Fungiziden an der fest/fluessigen Grenzflaeche. Diploma Dissertation, Research Center Juelich, Institute of Applied Physical Chemistry, 1994.
39. Furtak, T. E.; Macomber, S. H. Chem. Phys. Lett. 1983, 95, 328-332.
40. Ingram, J. C.; Pemberton, J. E. Langmuir 1992, 8, 2034-2039.
41. Van Duyne, R. P.; Hulteen, J. C.; Treichel, D. A. J. Chem. Phys. 1993, 99, 2101-2115.
42. Roark, S. E.; Semin, D. J.; Lo, A.; Skodje, R. T.; Rowlen, K. L. Anal. Chim. Acta 1995, 307, 341-353.
43. Knoll, W.; Philpott, M. R.; Golden, W. G. J. Chem. Phys. 1982, 77, 219-225.
44. Pockrand, I. In Springer tracts in modern physics; Springer-Verlag: Berlin, 1984; Vol. 104, pp 1-164.
45. Jaycock, M. J.; Ottewill, R. H.; Restogi, M. C. In IIIrd International Congress of Surface Activity, Cologne, 1960; Vol. IIB, p 283.