Surface resistance and penetration depth of YBa2Cu 3O7-δ thin films on silicon at ultrahigh frequencies

Applied Physics Letters

Volumn 64, Issue 24, 1994, Pages 3326-3328

  Jaekel, Christian ^a   Waschke, Christian ^a   Roskos, Hartmut G ^a   Kurz, Heinrich ^a   Prusseit, Werner ^b   Kinder, Helmut ^b  

^a UNIVERSITY HOSPITAL RWTH AACHEN   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

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EID: 0000170684     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.111267     Document Type: Article

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