Transmission-line-matrix modeling of grain-boundary diffusion in thin films

Journal of Applied Physics

Volumn 74, Issue 12, 1993, Pages 7173-7180

  Gui, Xiang ^a   Dew, Steven K ^a   Brett, Michael J ^a   De Cogan, Donard ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b UNIVERSITY OF EAST ANGLIA   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000169251     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.355034     Document Type: Article

References (0)