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Volumn 7, Issue 3, 1994, Pages 619-630

The Development of Chemically Amplified Positive- and Negative-tone Resists for DUV Lithography

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EID: 0000160225     PISSN: 09149244     EISSN: 13496336     Source Type: Journal    
DOI: 10.2494/photopolymer.7.619     Document Type: Article
Times cited : (26)

References (29)
  • 1
    • 0026203822 scopus 로고    scopus 로고
    • Chemically Amplified Resists,” Solid State Technology
    • A.A. Lamola, C.R. Szmanda, J.W. Thackeray, “Chemically Amplified Resists,” Solid State Technology, 8, 53.
    • , vol.8 , pp. 53
    • Lamola, A.A.1    Szmanda, C.R.2    Thackeray, J.W.3
  • 3
    • 0024680457 scopus 로고
    • Solid State Technology
    • J. R. Sheats, Solid State Technology, 32, 79 (1989).
    • (1989) , vol.32 , pp. 79
    • Sheats, J.R.1
  • 25
    • 85024340589 scopus 로고
    • The Determination of Ionization Constants; Chapman and Hall: New York
    • A. Albert, E. P. Serjeant, The Determination of Ionization Constants; Chapman and Hall: New York, pp. 144-164 (1984).
    • (1984) , pp. 144-164
    • Albert, A.1    Serjeant, E.P.2
  • 26
    • 0003472062 scopus 로고
    • Ionization Constants of Inorganic Acids and Bases in Aqueous Solution; Pergamon Press: New York
    • D.D. Perrin, Ionization Constants of Inorganic Acids and Bases in Aqueous Solution; Pergamon Press: New York (1982).
    • (1982)
    • Perrin, D.D.1
  • 27
    • 9844226628 scopus 로고
    • Superacids; John Wiley and Sons, New York
    • G. A. Olah, G.K.S. Prakash, J. Sommer, Superacids; John Wiley and Sons, New York, 24-27 (1985).
    • (1985) , pp. 24-27
    • Olah, G.A.1    Prakash, G.K.S.2    Sommer, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.