Systematic study of foreign-atom-doped fullerenes by using a nuclear recoil method and their MD simulation

Journal of Chemical Physics

Volumn 112, Issue 6, 2000, Pages 2834-2842

  Ohtsuki, T ^a   Ohno, K ^b   Shiga, K ^b   Kawazoe, Y ^b   Maruyama, Y ^c   Masumoto, K ^d  

^a TOHOKU UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^d HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000160169     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.480858     Document Type: Article

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