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Volumn 53, Issue 19, 1996, Pages 13047-13050

Oxygen-related defects in Si studied by variable-energy positron annihilation spectroscopy

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[No Author keywords available]

Indexed keywords


EID: 0000159562     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.13047     Document Type: Article
Times cited : (51)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.