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Proceedings of the IEEE
Volumn 89, Issue 3, 2001, Pages 223-225
Scanning the issue special issue on limits of semiconductor technology
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EID: 0000157640     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPROC.2001.915371     Document Type: Article
Times cited : (20)
References (2)
  • 1
    • 0029292398 scopus 로고
    • Low power microelectronics: Retrospect and prospect
    • Apr.
    • J. D. Meindl, "Low power microelectronics: Retrospect and prospect," Proc. IEEE, vol. 83, pp. 619-635, Apr. 1995.
    • (1995) Proc. IEEE , vol.83 , pp. 619-635
    • Meindl, J.D.1
  • 2
    • 0034295707 scopus 로고    scopus 로고
    • The fundamental limit on binary switching energy for terascale integration (TSI)
    • Oct.
    • [21 J. D. Meindl and J. A. Davis, "The fundamental limit on binary switching energy for terascale integration (TSI)," IEEE J. Solid-State Circuits, vol. 35, pp. 1515-1516, Oct. 2000.
    • (2000) IEEE J. Solid-State Circuits , vol.35 , pp. 1515-1516
    • Meindl, J.D.1    Davis, J.A.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.