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Volumn 63, Issue 7, 1988, Pages 2337-2345

Complex plane analysis of trapping phenomena in zinc oxide based varistor grain boundaries

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000157326     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.341176     Document Type: Article
Times cited : (102)

References (31)
  • 14
    • 84950922870 scopus 로고
    • Dielectric Materials and Applications, (Wiley, New York, 1954), p. 89. Also K. S. Van Dyke, in, edited by A. R. Von Hippel (Wiley, New York)
    • (1954) Dielectrics and Waves , pp. 257
    • Von Hippel, A.R.1
  • 31
    • 84950879165 scopus 로고
    • Extended Abstracts of the Electrochemical Society Fall Meeting, Vol. 85-2, Abstract No. 380-381, Las Vegas, Nevada, October 13–
    • (1985) , vol.18
    • Seitz, M.A.1    Alim, M.A.2    Hirthe, R.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.