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Volumn 44, Issue 6, 1991, Pages 2452-2460

Structural characterization of nanometer-sized crystalline Pd by x-ray-diffraction techniques

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000157232     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.44.2452     Document Type: Article
Times cited : (118)

References (24)
  • 10
    • 84927358087 scopus 로고    scopus 로고
    • G. W. Nieman and J. R. Weertman, Proceedings of the Morris E. Fine Symposium, Detroit, 1990, edited by P. K. Liaw et al.. (The Minerals, Metals, and Materials Society, Warrendale, PA, 1991), pp. 243-250.
  • 14
    • 84927358086 scopus 로고    scopus 로고
    • M. Müller-Stach, diplom thesis, 1990 (unpublished).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.