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Volumn 44, Issue 6, 1991, Pages 2452-2460
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Structural characterization of nanometer-sized crystalline Pd by x-ray-diffraction techniques
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000157232
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.44.2452 Document Type: Article |
Times cited : (118)
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References (24)
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