Using force modulation to image surface elasticities with the atomic force microscope

Nanotechnology

Volumn 2, Issue 2, 1991, Pages 103-106

  Maivald, P ^a   Butt, H J ^b   Gould, S A C ^b   Prater, C B ^b   Drake, B ^b   Gurley, J A ^a   Elings, V B ^a   Hansma, P K ^b  

^a Digital Instruments   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000156345     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/2/2/004     Document Type: Article

References (18)

1. Scanned-Probe Microscopes
2. Atomic force microscopy using optical interferometry
3. Atomic resolution with the atomic force microscope on conductors and nonconductors
4. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope
5. Surface Studies by Scanning Tunneling Microscopy