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Volumn 352, Issue 3, 1995, Pages 622-628
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Demonstration of phase-contrast X-ray computed tomography using an X-ray interferometer
a
HITACHI LTD
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000151470
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-9002(95)90017-9 Document Type: Article |
Times cited : (344)
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References (10)
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