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19
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11944271167
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note
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TXRF spectra were measured using an EXTRA IIA spectrometer (Atomika Instruments, Oberschleisaheim, Germany) equipped with excitation sources Mo Kα, W(L), and W(white), a Si(Li) solid-state detector, and a computer-controlled multichannel analyzer system. A 15 μL sample of each of the samples was pipetted onto a clean Perspex carrier and dried to a thin film, which was measured for 500 s with Mo Kα excitation.
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20
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11944264993
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note
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-3; all Δ/ρ values < 0.001. The H centers were placed at calculated positions.
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