A josephson junction time domain reflectometer with room temperature access

IEEE Transactions on Magnetics

Volumn 23, Issue 2, 1987, Pages 899-902

  Whiteley, S R ^a   Hohenwarter, G K G ^a   Faris, S M ^a  

^a HYPRES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000142892     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/TMAG.1987.1064882     Document Type: Article

References (6)

1. L.S. Yu, C.J. Berry, R. E. Drake, K. Li, R.M. Patt, M. Radparvar, S.R. Whiteley, and S.M. Faris, “An All Niobium Eight Level Process for Small and Medium Scale Applications‘’, in this proceedings.
2. G.K.G. Hohenwarter, J.A. Grange, and S.R. Whiteley, “A Fast Open Cycle Cryocooler for Cryogenic High Speed Signal Processing Circuits”, in this proceedings.
3. D.B. Tuckerman, “A Josephson Ultra-High Resolution Sampling System”, Appl. Phys. Lett., 36, 1008 (1980).
4. S.M. Faris, “Generation and Measurement of Ultrashort Current Pulses with Josephson Devices”, Appl. Phys. Lett., 36, 1005 (1980).
5. B.L. Van Zeghbroeck, “Model for a Josephson Sampling Gate”, J. Appl. Phys. 57, 2593 (1985).
6. R.E. Harris, P. Wolf, and D.F. Moore, “Electronically Adjustable Delay for Josephson Technology”, IEEE Electron Device Lett., EDL-3, 261 (1982).