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Volumn 70, Issue 10, 1999, Pages 4051-4054
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An instrument for the collection of simultaneous small and wide angle x-ray scattering and stress-strain data during deformation of polymers at high strain rates using synchrotron radiation sources
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000142360
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1150034 Document Type: Article |
Times cited : (24)
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References (13)
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