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Physical Review Letters

Volumn 71, Issue 20, 1993, Pages 3299-3302

Observation of buried interfaces with low energy electron microscopy

(4) Tromp, R M a Denier Van Der Gon, A W a Legoues, F K a Reuter, M C a

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000141921 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.71.3299 Document Type: Article

Times cited : (41)

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