A combined apparatus of scanning reflection electron microscope and scanning tunneling microscope

Review of Scientific Instruments

Volumn 68, Issue 1, 1997, Pages 116-119

  Maruno, S ^a   Nakahara, H ^b   Fujita, S ^a   Watanabe, H ^a   Kusumi, Y ^a   Ichikawa, M ^a  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000140187     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147750     Document Type: Article

References (11)

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