Nanometer-scale electropolymerization of aniline using the scanning tunneling microscope

Journal of Physical Chemistry

Volumn 100, Issue 42, 1996, Pages 17041-17049

  Nyffenegger, Ralph M ^a   Penner, Reginald M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000108451     PISSN: 00223654     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp962145r     Document Type: Article

References (32)

1. Nyffenegger, R. M.; Penner, R. M. Chem. Rev., in press.
2. Wiesendanger, R. Jpn. J. Appl. Phys., Part 1 1995, 34, 3388.
3. Dagata, J. A. Materials - Fabrication and Patterning at the Nanoscale. Symposium, 1995, p 153.
4. Sasano, K.; Nakamura, K.; Kaneto, K. Jpn. J. Appl. Phys., Part 2 1993, 32, L863.
5. Kranz, C.; Ludwig, M.; Gaub, H. E.; Schuhmann, W. Adv. Mater. 1995, 7, 38.
6. Wuu, Y.-M.; Fan, F.-R. F.; Bard, A. J. J. Electrochem. Soc. 1989, 136, 885.
7. Borgwarth, K.; Ricken, C.; Ebling, D. G.; Heinze, J. Ber. Bunsen-Ges. Phys. Chem. 1995, 99, 1421.
8. Yang, R.; Evans, D. F.; Hendrickson, W. A. Langmuir 1995, 11, 211.
9. Li, W.; Virtanen, J. A.; Penner, R. M. Appl. Phys. Lett. 1992, 60, 1181.
10. Li, W.; Duong, T.; Virtanen, J. A.; Penner, R. M. Electrochemical Deposition of Metal Nano-Disk Structures using the Scanning Tunneling Microscope. In Nanoscale Probes of the Solid/Liquid Interface; Gewirth, A. A., Siegenthaler, H., Eds.; Kluwer Academic Publishers: Dordrecht, The Netherlands, 1995.
11. Leikis, D. I.; Rybalka, K. V.; Sevastyanov, E. S.; Frumkin, A. N. J. Electroanal. Chem. 1973, 46, 161.
12. Frumkin, A. N.; Petrii, O. A. Electrochim. Acta 1975, 20, 347.
13. Nyffenegger, R. M. Ph.D., Berne, 1994.
14. Hsiao, G. S.
15. Heben, M. J.; Dovek, M. M.; Lewis, N. S.; Penner, R. M.; Quate, C. F. J. Microsc. 1988, 152, 651.
16. Diaz, A. F.; Logan, J. A. J. Electroanal. Chem. 1980, 111, 111.
17. Thyssen, A. Ph.D., Düsseldorf, 1989.
18. Li, W.; Hsiao, G. S.; Nyffenegger, R. M.; Virtanen, J. A.; Penner, R. M. Submitted for publication.
19. Li, W.; Virtanen, J. A.; Penner, R. M. J. Phys. Chem. 1992, 96, 6529.
20. Penner, R. M.; Heben, M. J.; Lewis, N. S.; Quate, C. F. Appl. Phys. Lett. 1991, 58, 1389.
21. Barbero, C.; Miras, M. C.; Haas, O.; Kötz, R. J. Electroanal. Chem. 1991, 310, 437.
22. Nyffenegger, R.; Ammann, E.; Siegenthaler, H.; Kötz, R. Electrochim. Acta 1995, 40, 1411.
23. Because the apparent geometry of a PANI nanostructure obtained from an STM image of the particle will be a convolution of the STM tip shape with the actual particle geometry, estimation of the particle volume from STM line scan integrations is useful for comparative purposes only and not as an absolute measurement of the particle volume.
24. Werner, L.; Marlow, F.; Hill, W.; Retter, U. Chem. Phys. Lett. 1992, 194, 39.
25. Holze, R. Electrochim. Acta 1987, 32, 1527.
26. Van Huong, C. N. J. Electroanal Chem. 1989, 264, 247.
27. Damaskin, B. B.; Petrii, O. A.; Batrakov, V. V. Adsorption of Organic Compounds on Electrodes; Plenum Press: New York, 1971.
28. Bockris, J. O. M.; Reddy, A. K. N. Modern Electrochemistry; an Introduction to an Interdisciplinary Area; Plenum Press: New York, 1970.
29. Desilvestro, J.; Scheifele, W.; Haas, O. J. Electrochem. Soc. 1992, 139, 2727.
30. Barbero, C.; Kötz, R. J. Electrochem. Soc. 1994, 141, 859.
31. Kaneto, K.; Kaneko, M.; Takashima, W. Jpn. J. Appl. Phys., Part 2 1995, 34, L837.
32. McCoy, C. H.; Wrighton, M. S. Chem. Mater. 1993, 5, 914.