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Volumn 84, Issue 3, 2000, Pages 503-506

Stability of si-interstitial defects: From point to extended defects

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000103843     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.84.503     Document Type: Article
Times cited : (98)

References (22)
  • 17
  • 22
    • 85035304766 scopus 로고
    • Akademie Verlag, Berlin
    • P. Ziesche and H. Eschrig (Akademie Verlag, Berlin, 1991), p. 11.
    • (1991) , pp. 11
    • Ziesche, P.1    Eschrig, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.