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Physical Review B

Volumn 48, Issue 19, 1993, Pages 14463-14471

High-resolution x-ray-scattering study of the structure of niobium thin films on sapphire

(5) Gibaud, A a Cowley, R A b McMorrow, D F b Ward, R C C b Wells, M R b

a UNIVERSITÉ DU MAINE (France)

b UNIVERSITY OF OXFORD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000099267 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.48.14463 Document Type: Article

Times cited : (62)

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