Stoichiometry control of atomic beam fluxes by precipitated impurity phase detection in growth of (Pr,Ce)2CuO4 and (La,Sr) 2CuO4 films

Applied Physics Letters

Volumn 67, Issue , 1995, Pages 2557-

  Naito, Michio ^a   Sato, Hisashi ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000094359     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.114431     Document Type: Article

References (12)

1. 4 are essentially 1 in our experience
2. The drift seems to be caused by changes in the position/shape of the electron beam spots and in the shape of the sources
3. It is noticed that the stoichiometric film is patterned with darker regions and lighter regions