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Volumn 70, Issue 1 II, 1999, Pages 1072-1075
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Microwave reflectometry diagnostic for density profile and fluctuation measurements on ASDEX Upgrade
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000088284
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1149439 Document Type: Article |
Times cited : (41)
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References (5)
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