Erasable nanometer-scale modification at the Au/Si interface by ballistic electron emission microscopy

Applied Physics Letters

Volumn 75, Issue 23, 1999, Pages 3668-3670

  Hasegawa, Y ^a,c   Akiyama, K ^a   Ono, M ^a   Kahng, S J ^a,d   Xue, Q K ^a   Nakayama, K ^a   Hashizume, T ^b   Sakurai, T ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b HITACHI LTD   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000085964     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125423     Document Type: Article

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