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Physical Review B

Volumn 23, Issue 8, 1981, Pages 3781-3787

Thickness effect on the extended-x-ray-absorption-fine-structure amplitude

(2) Stern, E A a Kim, K a

a UNIVERSITY OF WASHINGTON (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000074430 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.23.3781 Document Type: Article

Times cited : (261)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.