Surface characterization of smooth heteroepitaxial diamond layers on β-SiC (001)

Diamond and Related Materials

Volumn 6, Issue 2-4, 1997, Pages 277-281

  Mizuochi, Y ^a   Nagasawa, H ^b   Kawarada, H ^a  

^a WASEDA UNIVERSITY   (Japan)

^b HOYA CORPORATION   (Japan)

Author keywords

Atomic force microscopy; Crystal growth; Heteroepitaxy; Surface

Indexed keywords

EID: 0000073778     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0925-9635(96)00710-8     Document Type: Article

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