Measurement of the zero-bias electron transmittance as a function of energy for half- and quarter-electron-wavelength semiconductor quantum-interference filters

Applied Physics Letters

Volumn 72, Issue 3, 1998, Pages 374-376

  Guthrie, D K ^a   First, P N ^a   Gaylord, T K ^a   Glytsis, E N ^a   Leibenguth, R E ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000073675     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120741     Document Type: Article

References (10)

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