Tapping mode atomic force microscopy observation of self-affine fractal roughness in electrochemically roughened silver electrode surfaces

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1153-1156

  Otsuka, I ^a   Iwasaki, T ^a  

^a OHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000069282     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588419     Document Type: Article

References (24)

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