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Journal of Applied Physics

Volumn 86, Issue 8, 1999, Pages 4188-4191

Effects of stress relaxation of epitaxial SrRuO3 thin film on microstructures

(6) Pan, X Q a Jiang, J C a Tian, W a Gan, Q b Rao, R A b Eom, C B b

a UNIVERSITY OF MICHIGAN (United States)

b Duke University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000064163 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.371345 Document Type: Article

Times cited : (13)

References (15)

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