Low-energy electron diffraction study of the multilayer relaxation of Cu(211)

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 17, Issue 4, 1999, Pages 1635-1638

  Seyller, Th ^a   Diehl, R D ^a   Jona, F ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000060021     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581864     Document Type: Article

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