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Volumn 71, Issue 9, 1997, Pages 1225-1227

Direct observation of stacking fault tetrahedra in ZnSe/GaAs(001) pseudomorphic epilayers by weak beam dark-field transmission electron microscopy

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[No Author keywords available]

Indexed keywords


EID: 0000058990     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119858     Document Type: Article
Times cited : (24)

References (15)
  • 13
    • 85033319868 scopus 로고    scopus 로고
    • unpublished
    • K. K. Fung, N. Wang, and I. K. Sou, J. Chin. Electr. Microsc. Soc. 15. 191 (1996); N. Wang, I. K. Sou, and K. K. Fung (unpublished).
    • Wang, N.1    Sou, I.K.2    Fung, K.K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.