Exchange biasing in sputtered NiFe/PtMn bilayers

Journal of Applied Physics

Volumn 87, Issue 9 II, 2000, Pages 4918-4920

  Xi, Haiwen ^a   Bian, Bo ^a   Laughlin, David E ^a   White, Robert M ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000049158     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373202     Document Type: Article

References (23)

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