Application of principal wavelet component in pattern classification

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3391, Issue , 1998, Pages 194-205

  Watanapongse, Pirawat ^a   Szu, Harold H ^b  

^a KASETSART UNIVERSITY   (Thailand)

^b UNIVERSITY OF LOUISIANA AT LAFAYETTE   (United States)

Author keywords

Eigenimage; Pattern classification; Principal component analysis; Principal wavelet component; Wavelet Transform

Indexed keywords

DATA REDUCTION; IMAGE CLASSIFICATION; INPUT OUTPUT PROGRAMS; PATTERN RECOGNITION; PRINCIPAL COMPONENT ANALYSIS; REDUNDANCY; WAVELET TRANSFORMS;

CLASSIFICATION PERFORMANCE; CONTINUOUS WAVELET TRANSFORM; CURSE OF DIMENSIONALITY; DIMENSIONALITY REDUCTION; EIGEN-IMAGE; MULTIPLE RESOLUTION ANALYSIS; REDUNDANCY REDUCTIONS; WAVELET COMPONENTS;

CLASSIFICATION (OF INFORMATION);

EID: 0000044154     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.304903     Document Type: Conference Paper

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