Measurement dependence of the exchange bias

Journal of Applied Physics

Volumn 87, Issue 9 II, 2000, Pages 4960-4962

  Xi, Haiwen ^a   White, Robert M ^a   Rezende, Sergio M ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b FEDERAL UNIVERSITY OF PERNAMBUCO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000042169     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373215     Document Type: Article

References (15)

1. W. H. Meiklejohn and C. P. Bean, Phys. Rev. 102, 1413 (1956); 105, 904 (1957).
2. W. H. Meiklejohn and C. P. Bean, Phys. Rev. 102, 1413 (1956); 105, 904 (1957).
3. D. Heim, R. Fontana, C. Tsang, V. Speriosu, B. Gurney, and M. Williams, IEEE Trans. Magn. MAG-30, 316 (1994).
4. B. H. Miller and E. D. Dahlberg, Appl. Phys. Lett. 69, 3932 (1996).
5. V. Ström, B. J. Jönsson, and D. Dahlberg, J. Appl. Phys. 81, 5003 (1997).
6. R. D. McMichael, M. D. Stiles, P. J. Chen, and W. F. Egelhoff, Jr., Phys. Rev. B 58, 8605 (1998).
7. P. Miltenyi, M. Gruyters, G. Guntherodt, J. Nogues, and I. K. Schuller, Phys. Rev. B 59, 3333 (1999).
8. C. Mauri, H. C. Siegmann, P. S. Bagus, and E. Kay, J. Appl. Phys. 62, 3047 (1987).
9. L. Neel, in Selected Works of Louis Neel, edited by N. Kurti (Gordon and Breach, New York, 1988), p. 469.
10. H. Xi and R. M. White, Phys. Rev. B (in press).
11. J. Smit and H. C. Beljers, Philips Res. Rep. 10, 113 (1955).
12. A. Layadi, W. C. Cain, J.-W. Lee, and J. O. Artman, IEEE Trans. Magn. 23, 2993 (1987).
13. S. S. P. Parkin and V. S. Speriosu, in Magnetic Properties of Low-Dimensional Systems II, edited by L. M. Falicov, F. Mejia-Lira, and J. L. Moran-Lopez (Springer, Berlin, 1990), p. 110.
14. H. Xi, R. M. White, and S. M. Rezende, Phys. Rev. B. (in press).
15. H. Xi, K. R. Mountfield, and R. M. White, J. Appl. Phys. (submitted).