The Si-Ge bond: Rearrangements, migrations, and cleavages

Organometallics

Volumn 18, Issue 15, 1999, Pages 2855-2860

  Sharma, Sneh ^a,b   Caballero, Noel ^a   Li, Hong ^a   Pannell, Keith H ^a  

^a UNIVERSITY OF TEXAS AT EL PASO   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000041817     PISSN: 02767333     EISSN: None     Source Type: Journal    
DOI: 10.1021/om990169p     Document Type: Article

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