Analytic scaling functions applicable to dispersion measurements in percolative metal-insulator systems

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 20, 1998, Pages 13558-13564

  McLachlan, D ^a   Heiss, W ^a   Chiteme, C ^a   Wu, Junjie ^a  

^a UNIVERSITY OF THE WITWATERSRAND   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000027064     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.13558     Document Type: Article

References (24)

1. I. Webman, J. Jortner, and M. Cohen, Phys. Rev. B 11, 2885 (1975).
2. A. L. Efros and B. I. Shklovskii, Phys. Status Solidi B 76, 475 (1976).
3. J. P. Straley, J. Phys. C 9, 783 (1976).
4. J. P. Straley, J. Phys. C 10, 3009 (1977).
5. D. J. Bergman and Y. Imry, Phys. Rev. Lett. 39, 1222 (1977).
6. D. Stroud and D. J. Bergman, Phys. Rev. B 25, 2061 (1981).
7. J. P. Clerc, G. Girand, J. M. Langier, and J. M. Luck, Adv. Phys. 39, 191 (1990).
8. Ce-Wen Nan, Prog. Mater. Sci.37, 1 (1993).
9. J. Wu and D. S. McLachlan, Phys. Rev. B 56, 1236 (1997)
10. Y. Gefen, A. Aharony, and S. Alexander, Phys. Rev. Lett. 50, 77 (1983).
11. C. Chiteme and D. S. McLachlan, in Electrically Based Microstructure Characterization, edited by R. A. Gerhardt, M. A. Alim, and S. R. Taylor (Materials Research Society, Pittsburgh, 1998).
12. D. S. McLachlan, Physica B (to be published).
13. D. S. McLachlan, J. Phys. C 20, 865 (1987).
14. D. S. McLachlan, M. Blaskiewics, and R. Newnham, J. Am. Ceram. Soc. 73, 2187 (1990).
15. R. Landauer, Electrical Transport and Optical Properties of Inhomogeneous Media edited by J. C. Garland and D. B. Tanner, AIP Conf. Proc. No. 40 (American Institute of Physics, 1978), p. 2.
16. I. G. Chen and W. B. Johnson, J. Mat. Science 26, 1565 (1991).
17. L. Benguigui, J. Phys. (France) Lett. 46, L1015 (1985).
18. R. B. Laibowitz and Y. Gefen, Phys. Rev. Lett. 53, 380 (1984)
19. M. A. Van Dijk, G. Casteleijn, J. G. H. Joosten, and Y. K. Levine, J. Chem. Phys. 85, 626 (1986).
20. S. Bhattacharya, J. P. Stokes, M. W. Kim, and J. S. Huang, Phys. Rev. Lett. 55, 1884 (1985).
21. A. K. Jonscher, Universal Relaxation Law (Chelsea Dielectrics Press, London, 1996), Chap. 6.
22. Z. Hashim and S. Shtrikman, J. Appl. Phys. 33, 3123 (1962).
23. D. S. McLachlan, in Electrically Based Microstructure Characterization, edited by R. A. Gerhardt, S. R. Taylor, and E. J. Garboczi, MRS Symp. Proc. No. 411 (Materials Research Society, Pittsburgh, 1996), p. 309.
24. Michael B. Heaney, Phys. Rev. B 52, 12 477 (1995).