Studies of surface and interface segregation in polymer blends by secondary ion mass spectrometry

Molecular Physics

Volumn 76, Issue 4, 1992, Pages 937-950

  Schwarz, S A ^a   Wilkens, B J ^a   Pudensi, M A A ^a,d   Rafailovich, M H ^b   Sokolov, J ^b   Zhao, X ^b   Zhao, W ^b   Zheng, X ^b   Russell, T P ^c   Jones, R A L ^d  

^a TELCORDIA TECHNOLOGIES   (United States)

^b CITY UNIVERSITY OF NEW YORK   (United States)

^c IBM ALMADEN RESEARCH CENTER   (United States)

^d UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000024010     PISSN: 00268976     EISSN: 13623028     Source Type: Journal    
DOI: 10.1080/00268979200101771     Document Type: Article

References (24)

1. DOWBEN, P. A., and MILLER, A., 1990, Surface Segregation Phenomena (CRC Press).
2. KRAMER, E. J., 1991, Physica B, 173, 189.
3. MILLS, P. J., GREEN, P. F., PALMSTROM, C. J., MAYER, J. W., and KRAMER, E. J., 1984, AppL Phys. Lett., 45, 958.
4. SOKOLOV, J., RAEAILOVICH, M. H., JONES, R. A. L., and KRAMER, E. J., 1989, Appl. Phys. Lett., 54, 590.
5. SINHA, S. K., 1991, Physica B, 173, 25.
6. CHUJO, R., 1991, Polym. J., 23, 367.
7. DELINE, V. R., BROWN, H. R., and CHAR, K., 1991, J. Vac. Sci. Tech., A9, 1283.
8. COULON, G., RUSSELL, T. P., DELINE, V. R., and GREEN, P. F., 1989, Macromol, 22, 2581.
9. WAKRARKAR, V. S., DELINE, V. R., and RUSSELL, T. P., 1990, see ref. [12] pp. 363-366.
10. BENNINGHOVEN, A., RUDENAUER, F. G., and WERNER, H. W., 1987, Secondary Ion Mass Spectrometry (Wiley).
11. BRIGGS, D., and HEARN, M. J., 1986, Vacuum, 36, 1005.
12. BENNINGHOVEN, A., EVANS, C. A., MCKEEGAN, K. D., STORMS, H., and WERNER, H. W., editors, 1990, Secondary Ion Mass Spectrometry--SIMS VII, Proc. 7th Int. Conf., Monterey, USA 1989 (Wiley).
13. SCHWARZ, S. A., JONES, R. A. L., KRAMER, E. J., RAEAILOVICH, M. H., and SOKOLOV, J. C., 1990, see ref. [12] pp. 355-358.
14. SCHWARZ, S. A., 1990, J. appl. Phys., 68, 2382.
15. JONES, R. A. L., KRAMER, E. J., RAFAILOVICH, M. H., SOKOLOV, J., and SCHWARZ, S. A., 1989, Phys. Rev. Lett., 62, 280.
16. JONES, R. A. L., NORTON, L. J., KRAMER, E. J., COMPOSTO, R. J., STEIN, R. S., RUSSELL, T. P., MANSOUR, A., KARIM, A., FELCHER, G. P., RAFAILOVICH, M. H., SOKOLOV, J., ZHAO, X., and SCHWARZ, S. A., 1990, Europhys. Lett., 12, 41.
17. ZHAO, X., ZHAO, W., SOKOLOV, J., RAFAILOVICH, M. H., SCHWARZ, S. A., WILKENS, B. J., JONES, R. A. L., and KRAMER, E. J., 1991, Macromol., 24, 5991.
18. WHITLOW, S. J., and WOOD, R. P., 1989, Macromol., 22, 2648.
19. CHEN, Z. Y., NOOLANDI, J., and Izzo, D., 1991, Phys. Rev. Left., 66, 727.
20. TRUCKS, G. W., RAGHAVACHARI, K., HIGASHI, G. S., and CHABAL, Y. J., 1990, Phys. Rev. Lett., 65, 504.
21. MANSFIELD, T., STEIN, R. S., COMPOSTO, R. J., RAEAILOVICH, M. H., SOKOLOV, J., and SCHWARZ, S. A., 1991, Physica B, 173, 207.
22. MEIER, H., and STROBE, G. R., 1987, Macromol., 20, 649.
23. ZHAO, X., ZHAO, W., RAEAILOVICH, M. H., SOKOLOV, J., RUSSELL, Z. P., KUMAR, S. K., SCHWARZ, S. A., and WILKENS, B. J., 1991, Europhys. Lett., 15, 725.
24. BAUER, B. J., BRIBER, R. M., and HAN, C. C., 1989, Macromol., 22, 940.