Grazing incidence X-ray diffraction studies of thin films using an imaging plate detection system

Langmuir

Volumn 12, Issue 3, 1996, Pages 774-777

  Foran, Garry J ^a,c   Peng, Jian Bang ^b   Steitz, Roland ^b   Barnes, Geoffrey T ^b   Gentle, Ian R ^b  

^a AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^b UNIVERSITY OF QUEENSLAND   (Australia)

^c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000019859     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la950454n     Document Type: Article

References (11)

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8. Shih, M. C.; Peng, J. B.; Huang, K. G.; Dutta, P. Langmuir 1993, 9, 776.
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11. Schwartz, D. K.; Garnaes, J.; Viswanathan, R.; Chiruvolu, S.; Zasadzinski, J. A. N. Phys. Rev. E 1993, 47, 452.