Thermal expansion of single-crystalline (formula presented) the importance of temperature-induced strain for the electrical resistivity

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 3, 1999, Pages 1701-1705

  McClellan, K J ^c  

^a FLORIDA ATLANTIC UNIVERSITY   (United States)

^b WALTHER MEISSNER INSTITUT   (Germany)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000017616     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.1701     Document Type: Article

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